Industrial Defect Detection Through Computer Vision: A Survey - researchr publication authors

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Yunjie Tang, Kai Sun, Danhuai Zhao, Yan Lu, Jiaju Jiang, Hong Chen. Industrial Defect Detection Through Computer Vision: A Survey. In 7th IEEE International Conference on Data Science in Cyberspace, DSC 2022, Guilin, China, July 11-13, 2022. pages 605-610, IEEE, 2022. [doi]

This author has not been identified. Look up 'Yunjie Tang' in GoogleThis author has not been identified. Look up 'Kai Sun' in GoogleThis author has not been identified. Look up 'Danhuai Zhao' in GoogleThis author has not been identified. Look up 'Yan Lu' in GoogleThis author has not been identified. Look up 'Jiaju Jiang' in GoogleThis author has not been identified. Look up 'Hong Chen' in Google

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