Yunjie Tang, Kai Sun, Danhuai Zhao, Yan Lu, Jiaju Jiang, Hong Chen. Industrial Defect Detection Through Computer Vision: A Survey. In 7th IEEE International Conference on Data Science in Cyberspace, DSC 2022, Guilin, China, July 11-13, 2022. pages 605-610, IEEE, 2022. [doi]
@inproceedings{TangSZLJC22,
title = {Industrial Defect Detection Through Computer Vision: A Survey},
author = {Yunjie Tang and Kai Sun and Danhuai Zhao and Yan Lu and Jiaju Jiang and Hong Chen},
year = {2022},
doi = {10.1109/DSC55868.2022.00091},
url = {https://doi.org/10.1109/DSC55868.2022.00091},
researchr = {https://researchr.org/publication/TangSZLJC22},
cites = {0},
citedby = {0},
pages = {605-610},
booktitle = {7th IEEE International Conference on Data Science in Cyberspace, DSC 2022, Guilin, China, July 11-13, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7480-1},
}