Satoru Tanoi, Yasuhiro Tokunaga, Tetsuya Tanabe, Kazuhiko Takahashi, Atsuhiko Okada, Masahiro Itoh, Yoshiki Nagatomo, Yoshio Ohtsuki, Masaru Uesugi. On-wafer BIST of a 200-Gb/s failed-bit search for 1-Gb DRAM. J. Solid-State Circuits, 32(11):1735-1742, 1997. [doi]
@article{TanoiTTTOINOU97,
title = {On-wafer BIST of a 200-Gb/s failed-bit search for 1-Gb DRAM},
author = {Satoru Tanoi and Yasuhiro Tokunaga and Tetsuya Tanabe and Kazuhiko Takahashi and Atsuhiko Okada and Masahiro Itoh and Yoshiki Nagatomo and Yoshio Ohtsuki and Masaru Uesugi},
year = {1997},
doi = {10.1109/4.641694},
url = {https://doi.org/10.1109/4.641694},
researchr = {https://researchr.org/publication/TanoiTTTOINOU97},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {32},
number = {11},
pages = {1735-1742},
}