On-wafer BIST of a 200-Gb/s failed-bit search for 1-Gb DRAM

Satoru Tanoi, Yasuhiro Tokunaga, Tetsuya Tanabe, Kazuhiko Takahashi, Atsuhiko Okada, Masahiro Itoh, Yoshiki Nagatomo, Yoshio Ohtsuki, Masaru Uesugi. On-wafer BIST of a 200-Gb/s failed-bit search for 1-Gb DRAM. J. Solid-State Circuits, 32(11):1735-1742, 1997. [doi]

Abstract

Abstract is missing.