The Impact of Mislabelling on the Performance and Interpretation of Defect Prediction Models - researchr publication authors

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Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, Akinori Ihara, Ken-ichi Matsumoto. The Impact of Mislabelling on the Performance and Interpretation of Defect Prediction Models. In 37th IEEE/ACM International Conference on Software Engineering, ICSE 2015, Florence, Italy, May 16-24, 2015, Volume 1. pages 812-823, IEEE, 2015. [doi]

This author has not been identified. Look up 'Chakkrit Tantithamthavorn' in GoogleThis author has not been identified. Look up 'Shane McIntosh' in GoogleThis author has not been identified. Look up 'Ahmed E. Hassan' in GoogleThis author has not been identified. Look up 'Akinori Ihara' in GoogleThis author has not been identified. Look up 'Ken-ichi Matsumoto' in Google

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