Chakkrit Tantithamthavorn, Shane McIntosh, Ahmed E. Hassan, Akinori Ihara, Ken-ichi Matsumoto. The Impact of Mislabelling on the Performance and Interpretation of Defect Prediction Models. In 37th IEEE/ACM International Conference on Software Engineering, ICSE 2015, Florence, Italy, May 16-24, 2015, Volume 1. pages 812-823, IEEE, 2015. [doi]
@inproceedings{Tantithamthavorn15,
title = {The Impact of Mislabelling on the Performance and Interpretation of Defect Prediction Models},
author = {Chakkrit Tantithamthavorn and Shane McIntosh and Ahmed E. Hassan and Akinori Ihara and Ken-ichi Matsumoto},
year = {2015},
doi = {10.1109/ICSE.2015.93},
url = {http://dx.doi.org/10.1109/ICSE.2015.93},
researchr = {https://researchr.org/publication/Tantithamthavorn15},
cites = {0},
citedby = {0},
pages = {812-823},
booktitle = {37th IEEE/ACM International Conference on Software Engineering, ICSE 2015, Florence, Italy, May 16-24, 2015, Volume 1},
publisher = {IEEE},
isbn = {978-1-4799-1934-5},
}