Sarmad Tanwir, Michael S. Hsiao, Loganathan Lingappan. A Test Pattern Quality Metric for Diagnosis of Multiple Stuck-at and Transition faults. In Laleh Behjat, Jie Han, Miroslav N. Velev, Deming Chen, editors, Proceedings of the on Great Lakes Symposium on VLSI 2017, Banff, AB, Canada, May 10-12, 2017. pages 455-458, ACM, 2017. [doi]
@inproceedings{TanwirHL17,
title = {A Test Pattern Quality Metric for Diagnosis of Multiple Stuck-at and Transition faults},
author = {Sarmad Tanwir and Michael S. Hsiao and Loganathan Lingappan},
year = {2017},
doi = {10.1145/3060403.3060450},
url = {http://doi.acm.org/10.1145/3060403.3060450},
researchr = {https://researchr.org/publication/TanwirHL17},
cites = {0},
citedby = {0},
pages = {455-458},
booktitle = {Proceedings of the on Great Lakes Symposium on VLSI 2017, Banff, AB, Canada, May 10-12, 2017},
editor = {Laleh Behjat and Jie Han and Miroslav N. Velev and Deming Chen},
publisher = {ACM},
isbn = {978-1-4503-4972-7},
}