Mottaqiallah Taouil, Said Hamdioui, Erik Jan Marinissen. Quality versus cost analysis for 3D Stacked ICs. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{TaouilHM14, title = {Quality versus cost analysis for 3D Stacked ICs}, author = {Mottaqiallah Taouil and Said Hamdioui and Erik Jan Marinissen}, year = {2014}, doi = {10.1109/VTS.2014.6818763}, url = {http://dx.doi.org/10.1109/VTS.2014.6818763}, researchr = {https://researchr.org/publication/TaouilHM14}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014}, publisher = {IEEE}, }