Yoshiaki Tashiro, Shun Kawada, Shin Sakai, Shigetoshi Sugawa. Checker-pattern and shared two pixels LOFIC CMOS image sensors. In Proceedings of the 15th Asia South Pacific Design Automation Conference, ASP-DAC 2010, Taipei, Taiwan, January 18-21, 2010. pages 343-344, IEEE, 2010. [doi]
Abstract is missing.