Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Yasunori Tateno, Ken Nakata, Akio Oya, Keita Matsuda, Yoshihide Komatsu, Shinichi Osada, Masafumi Hirata, Shigeyuki Ishiyama, Toshiki Yoda, Atsushi Nitta, Tomio Sato. Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-4, IEEE, 2021. [doi]

This author has not been identified. Look up 'Yasunori Tateno' in GoogleThis author has not been identified. Look up 'Ken Nakata' in GoogleThis author has not been identified. Look up 'Akio Oya' in GoogleThis author has not been identified. Look up 'Keita Matsuda' in GoogleThis author has not been identified. Look up 'Yoshihide Komatsu' in GoogleThis author has not been identified. Look up 'Shinichi Osada' in GoogleThis author has not been identified. Look up 'Masafumi Hirata' in GoogleThis author has not been identified. Look up 'Shigeyuki Ishiyama' in GoogleThis author has not been identified. Look up 'Toshiki Yoda' in GoogleThis author has not been identified. Look up 'Atsushi Nitta' in GoogleThis author has not been identified. Look up 'Tomio Sato' in Google

runs on WebDSL