Yasunori Tateno, Ken Nakata, Akio Oya, Keita Matsuda, Yoshihide Komatsu, Shinichi Osada, Masafumi Hirata, Shigeyuki Ishiyama, Toshiki Yoda, Atsushi Nitta, Tomio Sato. Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-4, IEEE, 2021. [doi]
@inproceedings{TatenoNOMKOHIYN21,
title = {Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests},
author = {Yasunori Tateno and Ken Nakata and Akio Oya and Keita Matsuda and Yoshihide Komatsu and Shinichi Osada and Masafumi Hirata and Shigeyuki Ishiyama and Toshiki Yoda and Atsushi Nitta and Tomio Sato},
year = {2021},
doi = {10.1109/IRPS46558.2021.9405166},
url = {https://doi.org/10.1109/IRPS46558.2021.9405166},
researchr = {https://researchr.org/publication/TatenoNOMKOHIYN21},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021},
publisher = {IEEE},
isbn = {978-1-7281-6893-7},
}