Robust FinFET Memory Circuits with P-Type Data Access Transistors for Higher Integration Density and Reduced Leakage Power

Sherif A. Tawfik, Volkan Kursun. Robust FinFET Memory Circuits with P-Type Data Access Transistors for Higher Integration Density and Reduced Leakage Power. J. Low Power Electronics, 5(4):497-508, 2009. [doi]

Abstract

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