Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform - researchr publication authors

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Augusto Tazzoli, M. Cordoni, P. Colombo, C. Bergonzoni, Gaudenzio Meneghesso. Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform. Microelectronics Reliability, 50(9-11):1373-1378, 2010. [doi]

This author has not been identified. Look up 'Augusto Tazzoli' in GoogleThis author has not been identified. Look up 'M. Cordoni' in GoogleThis author has not been identified. It may be one of the following persons:

Pietro Colombo

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