Augusto Tazzoli, M. Cordoni, P. Colombo, C. Bergonzoni, Gaudenzio Meneghesso. Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform. Microelectronics Reliability, 50(9-11):1373-1378, 2010. [doi]
@article{TazzoliCCBM10,
title = {Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform},
author = {Augusto Tazzoli and M. Cordoni and P. Colombo and C. Bergonzoni and Gaudenzio Meneghesso},
year = {2010},
doi = {10.1016/j.microrel.2010.07.028},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.028},
tags = {C++},
researchr = {https://researchr.org/publication/TazzoliCCBM10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1373-1378},
}