Nasr-Eddine Ouldei Tebina, Nacer-Eddine Zergainoh, Guillaume Hubert, Paolo Maistri. Simulation Methodology for Assessing X-Ray Effects on Digital Circuits. In Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.