Test and recovery for fine-grained nanoscale architectures

Mohammad Tehranipoor, Reza M. Rad. Test and recovery for fine-grained nanoscale architectures. In Steven J. E. Wilton, André DeHon, editors, Proceedings of the ACM/SIGDA 14th International Symposium on Field Programmable Gate Arrays, FPGA 2006, Monterey, California, USA, February 22-24, 2006. pages 226, ACM, 2006. [doi]

Authors

Mohammad Tehranipoor

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Reza M. Rad

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