Mohammad Tehranipoor, Reza M. Rad. Test and recovery for fine-grained nanoscale architectures. In Steven J. E. Wilton, André DeHon, editors, Proceedings of the ACM/SIGDA 14th International Symposium on Field Programmable Gate Arrays, FPGA 2006, Monterey, California, USA, February 22-24, 2006. pages 226, ACM, 2006. [doi]
@inproceedings{TehranipoorR06a,
title = {Test and recovery for fine-grained nanoscale architectures},
author = {Mohammad Tehranipoor and Reza M. Rad},
year = {2006},
doi = {10.1145/1117201.1117240},
url = {http://doi.acm.org/10.1145/1117201.1117240},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/TehranipoorR06a},
cites = {0},
citedby = {0},
pages = {226},
booktitle = {Proceedings of the ACM/SIGDA 14th International Symposium on Field Programmable Gate Arrays, FPGA 2006, Monterey, California, USA, February 22-24, 2006},
editor = {Steven J. E. Wilton and André DeHon},
publisher = {ACM},
isbn = {1-59593-292-5},
}