Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nourani. Multiple Transition Model and Enhanced Boundary Scan Architecture to Test Interconnects for Signal Integrity. In 21st International Conference on Computer Design (ICCD 2003),VLSI in Computers and Processors, 13-15 October 2003, San Jose, CA, USA, Proceedings. pages 554, IEEE Computer Society, 2003. [doi]
Abstract is missing.