Menbere Tekleyohannes, MohammadSadegh Sadri, Christian Weis, Norbert Wehn, Martin Klein, Michael Siegrist. An advanced embedded architecture for connected component analysis in industrial applications. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 734-735, IEEE, 2017. [doi]
Abstract is missing.