Ramesh C. Tekumalla, Premachandran R. Menon. Delay Testing with Clock Control: An Alternative to Enhanced Scan. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 454-462, IEEE Computer Society, 1997.
@inproceedings{TekumallaM97,
title = {Delay Testing with Clock Control: An Alternative to Enhanced Scan},
author = {Ramesh C. Tekumalla and Premachandran R. Menon},
year = {1997},
tags = {testing, C++},
researchr = {https://researchr.org/publication/TekumallaM97},
cites = {0},
citedby = {0},
pages = {454-462},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}