Vasileios Tenentes, S. Saqib Khursheed, Bashir M. Al-Hashimi, Shida Zhong, Sheng Yang. High Quality Testing of Grid Style Power Gating. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 186-191, IEEE Computer Society, 2014. [doi]
Abstract is missing.