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Vasileios Tenentes, Daniele Rossi, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, Steve R. Gunn. Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure. IEEE Trans. VLSI Syst., 25(4):1397-1407, 2017. [doi]