Vasileios Tenentes, Daniele Rossi, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, Steve R. Gunn. Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure. IEEE Trans. VLSI Syst., 25(4):1397-1407, 2017. [doi]
@article{TenentesRYKAG17,
title = {Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure},
author = {Vasileios Tenentes and Daniele Rossi and Sheng Yang and S. Saqib Khursheed and Bashir M. Al-Hashimi and Steve R. Gunn},
year = {2017},
doi = {10.1109/TVLSI.2016.2626218},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2016.2626218},
researchr = {https://researchr.org/publication/TenentesRYKAG17},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {25},
number = {4},
pages = {1397-1407},
}