Radu Teodorescu, Jun Nakano, Abhishek Tiwari, Josep Torrellas. Mitigating Parameter Variation with Dynamic Fine-Grain Body Biasing. In 40th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO-40 2007), 1-5 December 2007, Chicago, Illinois, USA. pages 27-42, IEEE Computer Society, 2007. [doi]
Abstract is missing.