Luigi Ternullo Jr., R. Dean Adams, John Connor, Garret S. Koch. Deterministic Self-Test of a High-Speed Embedded Memory and Logic Processor Subsystem. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 33-44, IEEE Computer Society, 1995.
Abstract is missing.