Luca Testa, Hervé Lapuyade, Yann Deval, Olivier Mazouffre, Jean-Louis Carbonéro, Jean-Baptiste Begueret. BIST scheme for RF VCOs allowing the self-correction of the cut. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-10, IEEE, 2009. [doi]
Abstract is missing.