Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ken Butler, Ira Leventhal, Joe Xiao. Improvements in Automated IC Socket Pin Defect Detection. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 568-572, IEEE, 2022. [doi]
Abstract is missing.