Reliability Evaluation of Silicon Interconnect Fabric Technology - researchr publication authors

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Kannan K. Thankappan, Adeel Ahmad Bajwa, Boris Vaisband, SivaChandra Jangam, Subramanian S. Iyer. Reliability Evaluation of Silicon Interconnect Fabric Technology. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]

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