Kannan K. Thankappan, Adeel Ahmad Bajwa, Boris Vaisband, SivaChandra Jangam, Subramanian S. Iyer. Reliability Evaluation of Silicon Interconnect Fabric Technology. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{ThankappanBVJI19,
title = {Reliability Evaluation of Silicon Interconnect Fabric Technology},
author = {Kannan K. Thankappan and Adeel Ahmad Bajwa and Boris Vaisband and SivaChandra Jangam and Subramanian S. Iyer},
year = {2019},
doi = {10.1109/IRPS.2019.8720516},
url = {https://doi.org/10.1109/IRPS.2019.8720516},
researchr = {https://researchr.org/publication/ThankappanBVJI19},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}