Dhruv Thapar, Simon Thomann, Arjun Chaudhuri, Hussam Amrouch, Krishnendu Chakrabarty. Analysis and Characterization of Defects in FeFETs. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 256-265, IEEE, 2023. [doi]
Abstract is missing.