Shiva Shankar Thiagarajan, Suriyaprakash Natarajan, Yiorgos Makris. A defect tolerance framework for improving yield. In Rob Oshana, editor, DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10 - 14, 2022. pages 847-852, ACM, 2022. [doi]
Abstract is missing.