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On the Analysis and the Mitigation of Power Supply Noise and Power Distribution Network Impedance Variation for Scan-Based Delay Testing Techniques

Claude Thibeault, Ghyslain Gagnon. On the Analysis and the Mitigation of Power Supply Noise and Power Distribution Network Impedance Variation for Scan-Based Delay Testing Techniques. IEEE Trans. VLSI Syst., 26(7):1377-1390, 2018. [doi]

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