Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors

Claude Thibeault, Yassine Hariri, C. Hobeika. Tester Memory Requirements and Test Application Time Reduction for Delay Faults with Digital Captureless Test Sensors. J. Electronic Testing, 28(2):229-242, 2012. [doi]

Abstract

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