Characterization of semiconductor interfaces using a modified mixed mode bending apparatus

J. Thijsse, Olaf van der Sluis, J. A. W. van Dommelen, Willem D. van Driel, M. G. D. Geers. Characterization of semiconductor interfaces using a modified mixed mode bending apparatus. Microelectronics Reliability, 48(3):401-407, 2008. [doi]

Authors

J. Thijsse

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Olaf van der Sluis

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J. A. W. van Dommelen

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Willem D. van Driel

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M. G. D. Geers

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