Scott Thomas, Rafic Z. Makki, Sai Kishore Vavilala. Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing. In 2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia. pages 195-202, IEEE Computer Society, 2004. [doi]
@inproceedings{ThomasMV04,
title = {Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing},
author = {Scott Thomas and Rafic Z. Makki and Sai Kishore Vavilala},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/delta/2004/2081/00/20810195abs.htm},
tags = {testing, analysis},
researchr = {https://researchr.org/publication/ThomasMV04},
cites = {0},
citedby = {0},
pages = {195-202},
booktitle = {2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia},
publisher = {IEEE Computer Society},
isbn = {0-7695-2081-2},
}