Anu Thomas, B. John Oommen. Optimal "Anti-Bayesian" Parametric Pattern Classification for the Exponential Family Using Order Statistics Criteria. In Aurélio J. C. Campilho, Mohamed S. Kamel, editors, Image Analysis and Recognition - 9th International Conference, ICIAR 2012, Aveiro, Portugal, June 25-27, 2012. Proceedings, Part I. Volume 7324 of Lecture Notes in Computer Science, pages 11-18, Springer, 2012. [doi]
Abstract is missing.