Haitong Tian, Yuelin Du, Hongbo Zhang, Zigang Xiao, Martin D. F. Wong. Constrained pattern assignment for standard cell based triple patterning lithography. In Jörg Henkel, editor, The IEEE/ACM International Conference on Computer-Aided Design, ICCAD'13, San Jose, CA, USA, November 18-21, 2013. pages 178-185, IEEE/ACM, 2013. [doi]
Abstract is missing.