Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer. An optimal test pattern selection method to improve the defect coverage. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]
@inproceedings{TianGSM05,
title = {An optimal test pattern selection method to improve the defect coverage},
author = {Yuxin Tian and Michael R. Grimaila and Weiping Shi and M. Ray Mercer},
year = {2005},
doi = {10.1109/TEST.2005.1584039},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584039},
researchr = {https://researchr.org/publication/TianGSM05},
cites = {0},
citedby = {0},
pages = {9},
booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005},
publisher = {IEEE},
isbn = {0-7803-9038-5},
}