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Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer. An optimal test pattern selection method to improve the defect coverage. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]

The following publications are possibly variants of this publication:

Improved Launch for Higher TDF Coverage With Fewer Test PatternsYouhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki. tcad, 29(8):1294-1299, 2010. [doi]

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