Huixin Tian, Chris Kanich, Jason Polakis, Sameer Patil. Tech Pains: Characterizations of Lived Cybersecurity Experiences. In IEEE European Symposium on Security and Privacy Workshops, EuroS&P Workshops 2020, Genoa, Italy, September 7-11, 2020. pages 250-259, IEEE, 2020. [doi]
Abstract is missing.