A reconfigurable test method based on LFSR for 3D stacking integrated circuits

Chen Tian, JianYong Lu, Liu Jun, Huaguo Liang, Yingchun Lu, Maoxiang Yi. A reconfigurable test method based on LFSR for 3D stacking integrated circuits. Integration, 87:82-89, 2022. [doi]

Abstract

Abstract is missing.