Yuanxin Tian, Yuejun Zhang, Huihong Zhang, Liang Wen, Pengjun Wang, Zhiyi Li. An Architecture of a Single-Event Tolerant D Flip-flop Using Full-Custom Design in 28nm Process. In 15th IEEE International Conference on ASIC, ASICON 2023, Nanjing, China, October 24-27, 2023. pages 1-4, IEEE, 2023. [doi]
Abstract is missing.