Kevin Tien, Ken Inoue, Scott Lekuch, David J. Frank, Sudipto Chakraborty, Pat Rosno, Thomas Fox, Mark Yeck, Joseph A. Glick, Raphael Robertazzi, Ray Richetta, John F. Bulzacchelli, Daniel Ramirez, Dereje Yilma, Andrew Davies, Rajiv V. Joshi, Devin Underwood, Dorothy Wisnieff, Christian W. Baks, Donald Bethune, John Timmerwilke, Blake R. Johnson, Brian P. Gaucher, Daniel J. Friedman. A Cryo-CMOS Transmon Qubit Controller and Verification with FPGA Emulation. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 13-16, IEEE, 2022. [doi]
@inproceedings{TienILFCRFYGRRB22,
title = {A Cryo-CMOS Transmon Qubit Controller and Verification with FPGA Emulation},
author = {Kevin Tien and Ken Inoue and Scott Lekuch and David J. Frank and Sudipto Chakraborty and Pat Rosno and Thomas Fox and Mark Yeck and Joseph A. Glick and Raphael Robertazzi and Ray Richetta and John F. Bulzacchelli and Daniel Ramirez and Dereje Yilma and Andrew Davies and Rajiv V. Joshi and Devin Underwood and Dorothy Wisnieff and Christian W. Baks and Donald Bethune and John Timmerwilke and Blake R. Johnson and Brian P. Gaucher and Daniel J. Friedman},
year = {2022},
doi = {10.23919/DATE54114.2022.9774702},
url = {https://doi.org/10.23919/DATE54114.2022.9774702},
researchr = {https://researchr.org/publication/TienILFCRFYGRRB22},
cites = {0},
citedby = {0},
pages = {13-16},
booktitle = {2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022},
editor = {Cristiana Bolchini and Ingrid Verbauwhede and Ioana Vatajelu},
publisher = {IEEE},
isbn = {978-3-9819263-6-1},
}