Multivariate outlier modeling for capturing customer returns - How simple it can be

Jeff Tikkanen, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir. Multivariate outlier modeling for capturing customer returns - How simple it can be. In 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014. pages 164-169, IEEE, 2014. [doi]

Abstract

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