Daniel Tille, Stephan Eggersglüß, Rene Krenz-Baath, Jürgen Schlöffel, Rolf Drechsler. Improving CNF representations in SAT-based ATPG for industrial circuits using BDDs. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 176-181, IEEE Computer Society, 2010. [doi]
Abstract is missing.