Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
D. Z.-Y. Ting, Erik S. Daniel, T. C. Mcgill. Interface Roughness Effects in Ultra-Thin Tunneling Oxides. VLSI Design, 1998(1):47-51, 1998. [doi]
Abstract is missing.