Voltage Spikes on the Substrate to Obtain Timing Faults

Karim Tobich, Philippe Maurine, Pierre-Yvan Liardet, Mathieu Lisart, Thomas Ordas. Voltage Spikes on the Substrate to Obtain Timing Faults. In 2013 Euromicro Conference on Digital System Design, DSD 2013, Los Alamitos, CA, USA, September 4-6, 2013. pages 483-486, IEEE, 2013. [doi]

Authors

Karim Tobich

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Philippe Maurine

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Pierre-Yvan Liardet

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Mathieu Lisart

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Thomas Ordas

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