Nondestructive measurement of layer structures in dielectric substrates by collimated terahertz time domain spectroscopy

Yuya Tojima, Hiroki Sudo, Takayuki Kubota, Keizo Cho, Hiroaki Nakabayashi, Koji Suizu. Nondestructive measurement of layer structures in dielectric substrates by collimated terahertz time domain spectroscopy. IEICE Electronic Express, 15(15):20180579, 2018. [doi]

Abstract

Abstract is missing.