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Defect-centric perspective of time-dependent BTI variability

M. Toledano-Luque, Ben Kaczer, Jacopo Franco, Philippe Roussel, Tibor Grasser, Guido Groeseneken. Defect-centric perspective of time-dependent BTI variability. Microelectronics Reliability, 52(9-10):1883-1890, 2012. [doi]

Authors

M. Toledano-Luque

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Ben Kaczer

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Jacopo Franco

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Philippe Roussel

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Tibor Grasser

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Guido Groeseneken

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