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Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area

Maria Toledano-Luque, Peter C. Paliwoda, M. Nour, Thomas Kauerauf, B. Min, G. Bossu, M. Siddabathula, Tanya Nigam. Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-6, IEEE, 2021. [doi]

Authors

Maria Toledano-Luque

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Peter C. Paliwoda

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M. Nour

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Thomas Kauerauf

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B. Min

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G. Bossu

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M. Siddabathula

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Tanya Nigam

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